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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Franco Jacopo Book cover
Title Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Franco Jacopo
ISBN 9789400776623
Size 265 x 400
Filesize 21.75 KB
Date added 27-12-2021
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Franco Jacopo

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Franco Jacopo